Low Voltage Scanning Electron Microscopy

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...

Scanning transmission low-energy electron microscopy

We discuss an extension to the transmission mode of the cathode-lens-equipped scanning electron microscope, enabling operation down to the lowest energies of electrons. Penetration of electrons through free-standing ultrathin films is examined along the full energy scale, and the contribution of the secondary electrons (SEs), released near the bottom surface of the sample, is shown, enhancing t...

Very Low Energy Scanning Electron Microscopy

Very low energy scanning electron microscopy is introduced as a scanning version of the low energy electron microscopy, i.e. the emission electron microscopy with the sample excited by means of a parallel wave of electrons. The incident primary electrons are retarded in the cathode lens consisting of a negatively biased sample (cathode) and earthed anode. Interaction of slow electrons with soli...

Keysight Technologies Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy

Scanning ultrafast electron microscopy.

Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...